发明名称 READING METHOD OF SEMICONDUCTOR MEMORY AND SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor memory realizing high speed read operation. SOLUTION: The semiconductor memory comprises a capacitor 10 inserted into a bit line 3 between a memory cell 5 for bringing a precharged bit line 3 to a potential corresponding to stored data and an inverter 8 for detecting the potential of the bit line 3, a dummy memory cell 12 for causing transition of a precharged dummy bit line 11 to a different potential, first and second analog switches 14, 15 for switching connection of the bit line 3 and the dummy bit line 11 with the capacitor 10, a third analog switch 16 for short-circuiting the input and output of the inverter 8, and an amplification control circuit 17 for releasing short circuit before the potential of the bit line 3 reaches the threshold potential of the inverter 8 and controlling the first and second analog switches 14, 15 to connected the unconnected signal line with the capacitor 10.</p>
申请公布号 JP2001084790(A) 申请公布日期 2001.03.30
申请号 JP19990258158 申请日期 1999.09.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KINUYAMA SHINJI
分类号 G11C17/18;G11C11/419;G11C16/04;(IPC1-7):G11C17/18 主分类号 G11C17/18
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