发明名称 PLASMA ETHING OF SILICON SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for plasma etching of a mechanically ground silicon substrate which can ensure uniform etching quality with no variations. SOLUTION: A method for plasma etching of a silicon substrate for plasma- etching a silicon substrate 7 after grinding. After a first plasma processing, where with oxygen gas being supplied to a processing chamber 5, plasma discharging is executed to clean the silicon substrate 7, the surface of the silicon substrate 7 is removed by a second plasma processing, where with a mixed gas of oxygen gas and fluorine gas supplied to the processing chamber, plasma discharging is executed. Thereby, variation in etching quality caused by an organic contaminant can be eliminated and uniform plasma etching is executed.
申请公布号 JP2001085391(A) 申请公布日期 2001.03.30
申请号 JP19990257039 申请日期 1999.09.10
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HAJI HIROSHI;ARITA KIYOSHI;IWAI TETSUHIRO
分类号 H01L21/302;H01L21/3065;H05H1/46 主分类号 H01L21/302
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