发明名称 Metallization technique for gate electrodes and local interconnects
摘要 A process for making an integrated circuit is disclosed. This technique includes electrically interconnecting a pair of adjacent transistors positioned along a semiconductor substrate by coating with an oxide layer, planarizing the layer, then forming a trench exposing a contact region for each transistor. This trench is filled with a metal, such as tungsten to provide an electrical interconnection of the contact regions. The metal is then planarized to be approximately coplanar with the planarized oxide layer. Metal gate electrodes are formed at the same time as the interconnection. Additional processing includes depositing an IMO layer over the planarized metal and oxide and defining additional interconnections through the IMO layer.
申请公布号 US6207543(B1) 申请公布日期 2001.03.27
申请号 US19970885740 申请日期 1997.06.30
申请人 VLSI TECHNOLOGY, INC. 发明人 HARVEY IAN ROBERT;LIN XI-WEI
分类号 H01L21/285;H01L21/336;H01L21/60;H01L21/768;H01L29/45;H01L29/49;(IPC1-7):H01L2/320 主分类号 H01L21/285
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