发明名称 GATE CONDUCTOR FOR CONTROLLING LENGTH OF POLY WITHIN HIGH DENSITY DRAM
摘要 PURPOSE: A gate conductor for controlling a length of poly within a high density DRAM is provided to control a length of a polysilicon by improving a gate conductor process. CONSTITUTION: A semiconductor substrate(10) with a gate dielectric is provided. A gate stack including an oxide layer(12), a polysilicon layer(16), a gate conductor material layer(18), and a nitride layer(20) is formed on the gate dielectric. A gate conductor(22) with a sidewall is formed by etching the nitride layer(20) to the gate conductor material layer(18). A dielectric spacer(30) having the same level as a polysilicon layer sidewall(34) is formed at a gate conductor sidewall.
申请公布号 KR20010020918(A) 申请公布日期 2001.03.15
申请号 KR20000028950 申请日期 2000.05.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DIVAKARUNIRAMA CHANDRA;WAVE RIGHT MARI E.
分类号 H01L21/8242;H01L21/28;(IPC1-7):H01L21/824 主分类号 H01L21/8242
代理机构 代理人
主权项
地址