发明名称 |
GATE CONDUCTOR FOR CONTROLLING LENGTH OF POLY WITHIN HIGH DENSITY DRAM |
摘要 |
PURPOSE: A gate conductor for controlling a length of poly within a high density DRAM is provided to control a length of a polysilicon by improving a gate conductor process. CONSTITUTION: A semiconductor substrate(10) with a gate dielectric is provided. A gate stack including an oxide layer(12), a polysilicon layer(16), a gate conductor material layer(18), and a nitride layer(20) is formed on the gate dielectric. A gate conductor(22) with a sidewall is formed by etching the nitride layer(20) to the gate conductor material layer(18). A dielectric spacer(30) having the same level as a polysilicon layer sidewall(34) is formed at a gate conductor sidewall.
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申请公布号 |
KR20010020918(A) |
申请公布日期 |
2001.03.15 |
申请号 |
KR20000028950 |
申请日期 |
2000.05.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DIVAKARUNIRAMA CHANDRA;WAVE RIGHT MARI E. |
分类号 |
H01L21/8242;H01L21/28;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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地址 |
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