发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing thereof are provided to prevent a degradation of properties of capacitors by using a capacitor insulating film composed of an insulating metal oxide film. CONSTITUTION: A protective insulating film(106) is deposited over first and second field oxide transistors formed on a semiconductor substrate(100). A capacitor composed of a capacitor lower electrode(109), a capacitor insulating film(110A) composed of an insulating metal oxide film, and a capacitor upper electrode(111) is formed on the protective insulating film(106). A first contact plug(107) formed in the protective insulating film provides a direct connection between the capacitor lower electrode and an impurity diffusion layer(105) of the first field effect transistor. A second contact plug(108) formed in the protective insulating film provides a direct connection between the capacitor upper electrode and the impurity diffusion layer(105) of the second field effect transistor.
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申请公布号 |
KR20010020905(A) |
申请公布日期 |
2001.03.15 |
申请号 |
KR20000028573 |
申请日期 |
2000.05.26 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
NAGANO YOSHIHISA;UEMOTO YASUHIRO |
分类号 |
H01L21/768;H01L21/8242;H01L21/8246;H01L23/522;H01L27/02;H01L27/10;H01L27/105;H01L27/108;(IPC1-7):H01L27/02 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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