发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a method for manufacturing thereof are provided to prevent a degradation of properties of capacitors by using a capacitor insulating film composed of an insulating metal oxide film. CONSTITUTION: A protective insulating film(106) is deposited over first and second field oxide transistors formed on a semiconductor substrate(100). A capacitor composed of a capacitor lower electrode(109), a capacitor insulating film(110A) composed of an insulating metal oxide film, and a capacitor upper electrode(111) is formed on the protective insulating film(106). A first contact plug(107) formed in the protective insulating film provides a direct connection between the capacitor lower electrode and an impurity diffusion layer(105) of the first field effect transistor. A second contact plug(108) formed in the protective insulating film provides a direct connection between the capacitor upper electrode and the impurity diffusion layer(105) of the second field effect transistor.
申请公布号 KR20010020905(A) 申请公布日期 2001.03.15
申请号 KR20000028573 申请日期 2000.05.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAGANO YOSHIHISA;UEMOTO YASUHIRO
分类号 H01L21/768;H01L21/8242;H01L21/8246;H01L23/522;H01L27/02;H01L27/10;H01L27/105;H01L27/108;(IPC1-7):H01L27/02 主分类号 H01L21/768
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