发明名称 Electrical impedance tomography method
摘要 A method of imaging an object contained in a medium, having a specific impedance which is different from the specific impedance of the medium, comprising applying current to the medium at various locations at a surface of the medium, extracting current at other locations, detecting voltages produced by the current which has passed through the medium from the surface of the medium at various other locations, successively determining a location and shape and conductivity of the object with increasing accuracy by processing values of the detected voltages, determining a region in the medium in which the object is located from values of the detected voltages which are within upper and lower threshold values, applying acceleration procedures to the conductivities within the region in the course of iterative refinement of these values in the course of an imaging procedure, subsequently restricting further determination of the location of the object with increasing accuracy to voltages obtained from the region of the medium in which the object is located, and displaying an image on an axis using the restricted location determination values.
申请公布号 US6201990(B1) 申请公布日期 2001.03.13
申请号 US19970943131 申请日期 1997.10.03
申请人 TASC LTD. 发明人 WEXLER ALVIN;MU ZHEN
分类号 A61B5/053;(IPC1-7):A61B5/053 主分类号 A61B5/053
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