发明名称 |
MOS transistor that inhibits punchthrough and method for fabricating the same |
摘要 |
A MOS transistor that includes: a semiconductor substrate; a well region formed in the semiconductor substrate, where a trench region is defined in the well region; an isolator formed on a corner of the trench region, where the trench region is filled with polysilicon; a gate conductor formed over the trench region; and source/drain regions formed within the well region laterally aligned to the gate conductor. A suitable method to form the MOS transistor includes the acts of: forming a well region in a semiconductor substrate; forming a trench region in the well region; forming an isolator in a corner of the trench region; filling the trench region with polysilicon; forming a gate conductor formed over the trench region; and forming source/drain regions within the well region on opposite sides of the gate conductor.
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申请公布号 |
US6200841(B1) |
申请公布日期 |
2001.03.13 |
申请号 |
US19980223236 |
申请日期 |
1998.12.30 |
申请人 |
ANAM SEMICONDUCTOR INC.;AMKOR TECHNOLOGY, INC. |
发明人 |
KIM SANG YONG |
分类号 |
H01L21/336;H01L29/06;H01L29/78;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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