发明名称 TRANSMISSION ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a transmission electron microscope, capable of always correctly acquiring the state of inclination and rotation of a sample. SOLUTION: In this transmission electron microscope, when a sample 1 is inclined, a sample inclining/rotating mechanism 2 is driven by the control from an electron microscope body control system 7. As a result, the sample 1 is inclined by a prescribed amount in an arbitrary direction. Information, such as the direction (way) of the inclination, is delivered from the electron microscope body control system 7 to a display control circuit 5. A graphic display CPU in the display control circuit 5 produces a signal for graphically displaying an inclination axis based on the inclination information and delivers it to a cathode-ray tube 6, along with the image data provided by a TV camera 4. As a result, the inclination axis 8 is displayed on the cathode-ray tube 6 along with the sample image. At this time, the upper half and the lower half of the inclination axis 8 are displayed in white and in red color, respectively. The display in red shows the sense of the inclination, and it is immediately determined from the display that the sample 1 is inclined in the red-colored direction, that is, toward the lower side (in the positive direction) on the image screen.
申请公布号 JP2001057170(A) 申请公布日期 2001.02.27
申请号 JP19990230607 申请日期 1999.08.17
申请人 JEOL LTD 发明人 TEZUKA HIDEKI
分类号 H01J37/22;(IPC1-7):H01J37/22 主分类号 H01J37/22
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