发明名称 Surface treatment of C-doped SiO2 film to enhance film stability during O2 ashing
摘要 A method for forming an insulation layer over a substrate. The method forms a carbon-doped silicon oxide layer by thermal chemical vapor deposition using an organosilane. The carbon-doped silicon oxide layer is subsequently cured and densified. In one embodiment, the cured film is densified in a nitrogen-containing plasma. The method is particularly suitable for deposition of low dielectric constant films, i.e., where k is less than or equal to 3.0. Low-k, carbon-doped silicon oxide methylsilane or di-, tri-, tetra-, or phenylmethylsilane. and ozone. The above method can be carried out in a substrate processing system having a process chamber; a substrate holder, a heater, a gas delivery system, and a power supply, all of which are coupled to a controller. The controller contains a memory having a computer-readable medium with a program embodied for directing operation of the system in accordance with above method.
申请公布号 EP1077477(A1) 申请公布日期 2001.02.21
申请号 EP19990402072 申请日期 1999.08.17
申请人 APPLIED MATERIALS, INC. 发明人 XIA, LI-QUN;GAILLARD, FREDERIC;LIM, TIAN-HOC;YIEH, ELLIE
分类号 C23C16/02;C23C16/40;C23C16/56;H01L21/3105;H01L21/316 主分类号 C23C16/02
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