发明名称 Memory cell configuration for a 1T/1C ferroelectric memory
摘要 A memory cell layout for use in a 1T/1C ferroelectric memory array includes an access transistor having a gate coupled to a word line and a current path coupled between a bit line and an internal cell node, a shunt word line extending across the memory cell that is electrically isolated from the word line and the access transistor within the physical boundary of the memory cell, and a ferroelectric capacitor coupled between the internal cell node and a plate line.
申请公布号 US6185123(B1) 申请公布日期 2001.02.06
申请号 US19990465724 申请日期 1999.12.17
申请人 RAMTRON INTERNATIONAL CORPORATION 发明人 ALLEN JUDITH E.;KRAUS WILLIAM F.;LEHMAN LARK E.
分类号 G11C11/22;(IPC1-7):G11C7/00 主分类号 G11C11/22
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