发明名称 MEMORY ELEMENT AND METHOD FOR PROVIDING BIAS IN MEMORY ELEMENT
摘要 <p>PROBLEM TO BE SOLVED: To provide bias to a plurality of memory sectors in a memory element by bulk of a smaller region in a non-volatile memory element of especially a flash type and providing method for bias in a memory element. SOLUTION: A memory element 21 having a plurality of memory sectors 15 each sector of which includes a plurality of memory cells 1 is provided with a hierarchical sector decoding means. One group out of a plurality of groups of bias lines 28-32 is provided to each sector row, and is extended in parallel to a sector row. Each of a plurality of sector switching stages 35 is connected between a corresponding memory sector and a group corresponding to a bias line. A sector switching stage connected to memory sectors arranged in the same sector column is controlled by the same control signals S0, S1 supplied to a control line 40 extending in parallel to a sector column.</p>
申请公布号 JP2001028197(A) 申请公布日期 2001.01.30
申请号 JP20000196290 申请日期 2000.06.26
申请人 STMICROELECTRONICS SRL 发明人 MICHELONI RINO;ZAMMATTIO MATTEO;CAMPARDO GIOVANNI
分类号 G11C16/06;G11C8/12;G11C16/12;(IPC1-7):G11C16/06 主分类号 G11C16/06
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