发明名称 Method to form bottom electrode of capacitor
摘要 A method for fabricating a bottom electrode is provided. In this method a dielectric layer is formed on a substrate having a source/drain region. A via hole is formed in the dielectric layer to expose the source/drain region. A patterned, doped polysilicon layer is formed on the dielectric layer and fills the via hole, wherein the cross-section of the patterned doped polysilicon layer is arced or polygonal. The surface of the patterned polysilicon layer is transformed into an amorphous silicon layer. A hemispherical-grain layer is formed on the amorphous silicon layer.
申请公布号 US6177326(B1) 申请公布日期 2001.01.23
申请号 US19980208607 申请日期 1998.12.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 WU YI-TYNG;LIN KUO-CHI
分类号 H01L21/02;(IPC1-7):H01L21/20 主分类号 H01L21/02
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