SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS INSPECTING METHOD

摘要

PROBLEM TO BE SOLVED: To efficiently inspect signal transmission paths connecting an inspection signal creation point to an inspection signal observation point and to inspect delay failures in a larger number of signal transmission paths by a smaller number of inspecting circuits in a method for inspecting semiconductor integrated circuits. SOLUTION: In a semiconductor integrated circuit to which an inspecting circuit 100 is mounted, a predetermined signal transmission path to be an object of inspection is selected from among a plurality of signal transmission paths in a logic circuit 100a which constitutes the inspecting circuit 100. Then an inspection clock with a cycle according to a design delay time corresponding to the selected signal transmission path is outputted from an inspection timing creating part 210 to a register (inspection signal creation point) 201 and registers (inspection signal observation points) 202 and 203, and an inspection signal is created and observed at each register.