| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor storage device testing method, test control device, and semiconductor storage device capable of reliably testing a large number of semiconductor storage devices. SOLUTION: A burn-in device 100 includes a plurality of drivers. The drivers each generate external clock signals of different phases. A burn-in board 104 includes a plurality of sockets. The plurality of sockets are divided into two groups. The first group (S1) is supplied with an external clock signal outputted from the driver DR1, and the second group (S2) is provided with an external clock signal outputted from the driver DR2. A plurality of semiconductor devices are inserted into the sockets S1 and S2. By this constitution, the operating current of semiconductor storage devices which flows into the burn-in device 100 is reduced.
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