发明名称 Electron microscope
摘要 <p>An electron gun column (20) is supported on a support structure (10) formed in a rectangular parallelepiped. The electron gun column (20), a column evacuation device (30) and a viewing chamber (23) are mounted on the dampers on the support structure (10) through a vibration plate. A table (27) is mounted on the support structure (10). The table (27) may have an opening at a location corresponding to the viewing chamber (23) so that the table (27) and the viewing chamber (23), both mounted on the support structure (10), are not in contact with each other. The layout of the operation panel may divide the operation devices (50a,b,51,52) of the electron microscope into a group of devices that are frequently reached by touch and operated during observation and a group of devices that are not frequently used during observation. The former group may be arranged in arc areas within reach of the operator's arms when pivoted about the elbows as the operator rests his arms naturally on the operation table (27). The latter group may be classified according to the functions performed and is arranged in positions that are behind the arc areas of pivoting arms and are easily recognized visually.</p>
申请公布号 EP1069593(A2) 申请公布日期 2001.01.17
申请号 EP20000119480 申请日期 1996.08.30
申请人 HITACHI, LTD. 发明人 MIYATA, TOMOYUKI;HOHMANN, PETER;KATAYAMA, ATSUSHI;TSUBOI, DAIJI;KOBAYASHI, HIROYUKI;SATO, HISASHI;KURIYAMA, HIROYUKI
分类号 G01Q30/02;G01N23/00;H01J37/02;H01J37/26;(IPC1-7):H01J37/02 主分类号 G01Q30/02
代理机构 代理人
主权项
地址