发明名称 |
METHOD FOR FORMING STORAGE ELECTRODE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a charge storage electrode of a semiconductor I provided to form a charge storage electrode contact hole and a charge storage electrode by using only one mask. CONSTITUTION: An insulating layer(22) is formed on a semiconductor substrate(21). The first type photoresist layer is applied on the insulating layer(22). The first type photoresist layer is exposed by using a mask. The first photoresist layer pattern is formed by developing the first type photoresist layer. A contact hole is formed by etching the insulating layer(22). The first photoresist layer pattern is removed. A conductive layer is deposited on the whole structure. The second type photoresist layer is applied on the conductive layer. The second type photoresist layer is exposed by using the same mask. The second photoresist layer pattern is formed by developing the second type photoresist layer. A charge storage electrode(25') is formed by etching conductive layer.
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申请公布号 |
KR100273686(B1) |
申请公布日期 |
2000.12.15 |
申请号 |
KR19970027873 |
申请日期 |
1997.06.26 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, HYEONG-SOO |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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