发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To correctly read out data and reduce power consumption when the data is read out by forming a drain and a source regions of each memory cell transistor in a column direction of a part of a first and a second bit lines, connecting the memory cell transistor to a discharging means by the second bit line, and bringing the discharging means into an open state when the first bit line is started to be charged by a charging means. SOLUTION: A memory cell array consisting of memory cell transistors M1-M3 has word lines WL1-WLn connected to a gate electrode, and bit lines BIT11, BIT12... and BIT21, BIT22... connected to a drain electrode and a source electrode. Bit lines BIT11, BIT12 and BIT21, BIT22 are connected to a read charge transistor Tr4 and a discharge transistor Tr3 via bit line selection transistors Tr12, Tr11 and Tr21, Tr22 respectively. A charge control signal CKD is applied via a signal CKP and a delay circuit 10 to gate electrodes of the charge transistor Tr4 and discharge transistor Tr3.
申请公布号 JP2000339974(A) 申请公布日期 2000.12.08
申请号 JP19990145649 申请日期 1999.05.25
申请人 SHARP CORP 发明人 OKINO SHO
分类号 G11C16/02;G11C7/12;G11C16/06;G11C17/12 主分类号 G11C16/02
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