发明名称 METHOD AND APPARATUS FOR MEASURING INTERFACE
摘要 PROBLEM TO BE SOLVED: To obtain a method and an apparatus for measuring an interface accurately regardless of disturbance. SOLUTION: The interface measuring apparatus comprises means 3 for acquiring an original image including an interface to be measured at a preset sampling interval, and means 40 for locating the interface by analyzing the acquired original image. The image analyzing means 40 comprises a section 40b for operating the differential image between current and past original images, a section 40e for obtaining an image by extracting the variation of the original image based on the differential image, and a section 40f for locating the interface based on the extracted image.
申请公布号 JP2000329608(A) 申请公布日期 2000.11.30
申请号 JP19990140457 申请日期 1999.05.20
申请人 SUMITOMO CHEM CO LTD 发明人 HIROSE OSAMU
分类号 G01F23/28;G06T1/00;G06T7/60;G06T9/20 主分类号 G01F23/28
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