发明名称 Process of forming a refractory metal thin film
摘要 A process for forming a refractory metal thin film on a substrate by subjecting a gaseous mixture containing a halide of a refractory metal and the hydrogen gas to a plasma chemical vapor deposition, comprising the step of adjusting a mixing ratio of the halide of the refractory metal to the hydrogen gas to a relatively small value at an initial stage of the process and, subsequent to the initial stage of the process, adjusting the mixing ratio of the halide of the refractory metal to the hydrogen gas to a relatively large value.
申请公布号 US6143377(A) 申请公布日期 2000.11.07
申请号 US19980024893 申请日期 1998.02.17
申请人 SONY CORPORATION 发明人 MIYAMOTO, TAKAAKI
分类号 C23C16/02;C23C16/08;H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H05H1/24 主分类号 C23C16/02
代理机构 代理人
主权项
地址