METHOD AND DEVICE FOR MEASURING DEFECT OF CRYSTAL ON CRYSTAL SURFACE,申请号KR1019980706960-传众专利搜索

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发明名称	METHOD AND DEVICE FOR MEASURING DEFECT OF CRYSTAL ON CRYSTAL SURFACE
摘要
申请公布号	KR20000064554(A)	申请公布日期	2000.11.06
申请号	KR1019980706960	申请日期	1998.09.04
申请人		发明人
分类号	G01B11/30;G01N21/88	主分类号	G01B11/30
代理机构		代理人
主权项
地址

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