| 摘要 |
PROBLEM TO BE SOLVED: To generate many test-mode selection signals without increasing the number of pins by scrambling a first signal and a second signal which are output respectively from a prescribed number of buffers connected respectively to an n-th pin from a second pin, and high-voltage detection signals which are output respectively from the prescribed number of high-voltage detection means connected respectively to the n-th pin from the second pin, respectively. SOLUTION: A buffer 32 and buffers 36-1 to 36-n buffer respective input signals Ai (where i=1 to n), and two kinds of signals PAiB, PAi (where i=1 to n) whose levels are mutually complementary are generated. High-voltage detectors 38-1 to 38-n generate signals SAi [where i=1 to (n-1)] when the respective input signals are high voltages. Scrambling circuits 40-1 to 40-n scramble the input signals PAiB, PAi (where i=1 to n) and the signals SAi [where i=1 to (n-1)], and signals PAiB, PPAi, SAj [where i=2 to n and j=1 to (n-1)] are generated.
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