发明名称 REPAIR CIRCUIT HAVING PROGRAMMING APPARATUS OF ANTIFUSE
摘要 PURPOSE: A repair circuit having a programming apparatus of an anti-fuse is provided wherein a repair process to replace a defective memory cell with a redundancy cell by an electrical programming method using a high voltage without using an expensive laser apparatus is simplified. CONSTITUTION: A repair circuit has a programming apparatus of an anti-fuse(60). The programming apparatus comprises: a first program voltage generating part(10) generating a first voltage of high level; a second program voltage generating part(20) generating a negative second voltage; an anti-fuse address generating part(30); a voltage dropping part(42); a boosting part(46); a ground voltage supplying part(44) driven by an inverted signal of an output of the anti-fuse address generating part; a power source voltage supplying part(48) driven by an output signal of the anti-fuse address generating part; a first switch signal generating part(52) outputting a signal inverted by a signal of a connection node of the voltage dropping part and the ground voltage supplying part; a second switch signal generating part(54) outputting a signal inverted by a signal of a connection node of the boosting part and the power source voltage supplying part; a first program voltage supplying part(56) applying the first voltage to the anti-fuse by an output of the first switch signal generating part; and a second program voltage supplying part(58) applying the second voltage to the anti-fuse by an output of the second switch generating part. Therefore, the repair process after packaging is possible because the programming can be performed simply and certainly using the voltage difference over both ends of the anti-fuse.
申请公布号 KR20000061895(A) 申请公布日期 2000.10.25
申请号 KR19990011276 申请日期 1999.03.31
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 RYU, DEOK HYEON;SUL, YEONG HO
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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