发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a bipolar transistor which can operate at high speed with satisfactory yield and at a low cost. SOLUTION: In this method, a semiconductor device, which comprises an integrated circuit having a bipolar transistor, is manufactured using SST(super self-aligned process technology) technique. In this case, by optimizing the grown thickness of a polysilicon film 9 which is later to be formed as a P+type base electrode polysilicon film 10, the operational speed of the bipolar transistor can be improved and simultaneously its namufacturing yield can be improved to reduce its cost.
申请公布号 JP2000299324(A) 申请公布日期 2000.10.24
申请号 JP19990106508 申请日期 1999.04.14
申请人 NEC CORP 发明人 IWADARE CHIKASHI
分类号 H01L29/73;H01L21/331;H01L29/732;(IPC1-7):H01L21/331 主分类号 H01L29/73
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