发明名称 NITRIDE SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To obtain a nitride semiconductor device, a photodetector and a flame sensor, each having a semiconductor element structure wherein a good Ohmic contact electrodes can be formed on a p-AlxGa1-xN layer. SOLUTION: The device has a p-type semiconductor layer 1 composed of a p-AlxGa1-xN layer (x>0), the semiconductor layer 1 has a high impurity concentration layer 7 contg. at least Be as an impurity formed in a portion near its surface, the impurity concentration is higher than that in a lower layer near the surface portion, and metal electrodes 8 are formed on the surface of the high impurity concentration layer 7. The impurity concentration of this layer 7 is preferably over 1018 cm-3.
申请公布号 JP2000294824(A) 申请公布日期 2000.10.20
申请号 JP19990101217 申请日期 1999.04.08
申请人 OSAKA GAS CO LTD 发明人 HIRANO HIKARI;CYRIL PELNO;AMANO HIROSHI;AKASAKI ISAMU;TAMURA ITARU
分类号 H01L31/10;H01L21/28;H01L31/0248;(IPC1-7):H01L31/10;H01L31/024 主分类号 H01L31/10
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