| 摘要 |
PROBLEM TO BE SOLVED: To shorten test time by an arrangement wherein an uncompressing means provided for each pin uncompresses a compression pattern data transmitted from a transmitting means and stores it in a pattern memory provided for each pin. SOLUTION: A main frame ME comprises a test controller TSC, and a hard disc drive HDD and an pin electronics PE comprises a CPU, a memory 3, and a pattern generator 5. The TSC is provided with a compression means 1, and a transmitting means 2 wherein the compression means 1 compresses the not yet compressed pattern data of the HDD for each PE and stored it in the HDD. The transmitting means 2 reads out the compressed pattern data from the HDD and transmits that data. The memory 3 stores the compressed pattern data from the transmitting means 2. An uncompressing means 4 provided for the CPU uncompresses the pattern data from the memory 3 and stores it in a pattern memory 52. Consequently, the time required for writing the pattern data in the pattern memory can expect a performance corresponding to the compression ratio.
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