发明名称 SELF-TEST DEVICE AND METHOD IN MICRO PROCESSOR
摘要 PURPOSE: A self-test device and method in a micro processor is provided to compare a check sum, which is generated when a data writing process and stored in a ROM, with other check sum generated when authorizing a power and to display a status of a microprocessor according to the comparison. CONSTITUTION: A self-test device in a micro processor has an input unit(10), an oscillation unit(20), a micro processor(30), an output unit(40) and a display unit(50). The input unit(10) inputs a data inputted from the external. The oscillation unit(20) generates a standard clock signal according to the input data. After writing an input data of the input unit(10) into a user s ROM(read only memory), the micro processor(30) outputs a control signal. The output unit(40) decides an operation or not according to the output signal generated from the micro processor(30). The display unit(50) decides a lighting or not according to the output signal generated from the micro processor(30). The micro processor(30) compares a check sum data stored in a constant fill area of user s ROM with a check sum data generated by increasing an address of user s ROM.
申请公布号 KR20000060384(A) 申请公布日期 2000.10.16
申请号 KR19990008633 申请日期 1999.03.15
申请人 LG ELECTRONICS INC. 发明人 JUN, IL JIN
分类号 G06F11/30;(IPC1-7):G06F11/30 主分类号 G06F11/30
代理机构 代理人
主权项
地址
您可能感兴趣的专利