| 摘要 |
In accordance with the present invention, an x-ray diffraction apparatus (10) and method are provided in which an x-ray or goniometer head (12) can be adjusted in different directions to allow the head (12) to direct x-rays at a part (14) from various positions. In this manner, measurements can be taken from a wider region of the part (14) without requiring that the part (14) itself be moved or that an operator move the unit, which can be relatively heavy. In one aspect, the head (12) can be rotated about its internal axis so that it can more readily direct x-rays along curved surfaces of the parts (14) while keeping a substantially constant distance therefrom. It is preferred that the apparatus be a portable unit including adjustment means (18) to allow the x-ray head to be moved in the different directions so that it can be transported for use in the field. |
