发明名称 METHODS OF FORMING MEMORY CELL CAPACITOR PLATES IN MEMORY CELL CAPACITOR STRUCTURES
摘要 An improved method of forming a memory cell capacitor plate is disclosed. The method of forming a memory cell capacitor plate comprises the steps of depositing a sacrificial layer and forming an opening in the sacrificial layer. Then an electrode material layer which includes a substantially conductive material that remains substantially conductive upon exposure to oxygen is deposited over a top surface of the sacrificial layer and at least partially filling the opening. The method continues with removing a portion of the electrode material layer down to at least about a level of the sacrificial layer's top surface to define a top surface of the memory cell capacitor plate, followed by removal of the sacrificial layer.
申请公布号 WO0059011(A2) 申请公布日期 2000.10.05
申请号 WO2000US08638 申请日期 2000.03.30
申请人 LAM RESEARCH CORPORATION 发明人 KEIL, DOUGLAS, L.
分类号 H01L21/3205;H01L21/02;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/02 主分类号 H01L21/3205
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