发明名称 |
Element and apparatus for attenuated total reflection measurement, and method for measuring specific component using the same |
摘要 |
An improved attenuated total reflection (ATR) element and the measurement apparatus employing the element capable of performing a measurement with a high accuracy at a low operating cost is disclosed. An ATR element of the present invention permits an incident beam to have an internal total reflection at the surface, and comprises a projection protruded at the portion where the incident beam has the internal total reflection.
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申请公布号 |
US6128091(A) |
申请公布日期 |
2000.10.03 |
申请号 |
US19980139652 |
申请日期 |
1998.08.25 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
UCHIDA, SHINJI;ATSUTA, HIROSHI |
分类号 |
G01N21/27;G01N21/55;(IPC1-7):G01N21/01;G01N21/17 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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