发明名称 Element and apparatus for attenuated total reflection measurement, and method for measuring specific component using the same
摘要 An improved attenuated total reflection (ATR) element and the measurement apparatus employing the element capable of performing a measurement with a high accuracy at a low operating cost is disclosed. An ATR element of the present invention permits an incident beam to have an internal total reflection at the surface, and comprises a projection protruded at the portion where the incident beam has the internal total reflection.
申请公布号 US6128091(A) 申请公布日期 2000.10.03
申请号 US19980139652 申请日期 1998.08.25
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 UCHIDA, SHINJI;ATSUTA, HIROSHI
分类号 G01N21/27;G01N21/55;(IPC1-7):G01N21/01;G01N21/17 主分类号 G01N21/27
代理机构 代理人
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