发明名称 Subfield conductive layer and method of manufacture
摘要 A subfield conductive layer is provided, wherein a conductive layer is implanted beneath and laterally adjacent a field dielectric. The subfield conductive layer is placed within the silicon substrate after the field dielectric is formed. The conductive layer represents a buried interconnect which resides between isolated devices. The buried interconnect, however, is formed using high energy ion implant through a field dielectric formed either by LOCOS or shallow trench isolation techniques. The buried interconnect, or conductive layer, resides and electrically connects source and drain regions of two isolated devices.
申请公布号 US6127719(A) 申请公布日期 2000.10.03
申请号 US19980038464 申请日期 1998.03.11
申请人 ADVANCED MICRO DEVICES, INC. 发明人 FULFORD, JR., H. JIM;DAWSON, ROBERT;HAUSE, FRED N.;BANDYOPADHYAY, BASAB;MICHAEL, MARK W.;BRENNAN, WILLIAM S.
分类号 H01L21/74;(IPC1-7):H01L29/00;H01L31/119 主分类号 H01L21/74
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