发明名称 |
SUB-CARRIER, POLISHING DEVICE WITH SUB-CARRIER, AND MANUFACTURE OF WAFER USING IT |
摘要 |
PROBLEM TO BE SOLVED: To improve the uniformity of the polishing face and productivity by slightly tapering the outer circumferential face of a wafer. SOLUTION: A polishing device comprises a platen having a polishing cloth (pad) stuck to its upper surface and rotating and a sub-carrier 4 holding a wafer W, a material to be polished in such a state as pressurizing it towards the polishing cloth, while rotating. The sub-carrier 4 is provided with a cylindrical retainer ring (guide ring) 12 in the outer circumferential end so that the wafer W is not detached from the bottom face of the sub-carrier 4 during polishing. The outer circumference of the sub-carrier 4 is machined so as to form a taper part of the width 6 mm and the height 0.010 mm in the outer circumferential side in the surface of the water W side. This constitution can ease the pressure distribution in the outer circumference and consequently provide the wafer W with high flatness. |
申请公布号 |
JP2000271861(A) |
申请公布日期 |
2000.10.03 |
申请号 |
JP19990079466 |
申请日期 |
1999.03.24 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
KOBAYASHI TATSUNOBU;TANAKA HIROSHI |
分类号 |
B24B37/04;B24B37/30;H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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