发明名称 |
Tightening rings for integrated circuit tester heads |
摘要 |
An assembly ring includes a collar for removable assembly of the ring on a test head. The assembly ring further includes a disk having an open central portion and meant for supporting a periphery of a wafer, which provides an interface of electrical contact transfer between a test head and a circuit to be tested. A rotatable connection including a ball bearing is provided between the disk and the collar.
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申请公布号 |
US6127818(A) |
申请公布日期 |
2000.10.03 |
申请号 |
US19980066211 |
申请日期 |
1998.04.24 |
申请人 |
SGS-THOMSON MICROELECTRONICS S.A. |
发明人 |
MILESI, ROGER;NORAZ, DENIS;GIROLET, BERNARD;BAILLY, JEAN-MICHEL |
分类号 |
G01R1/04;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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