发明名称 METHOD FOR MANUFACTURING DUAL METAL GATE STRUCTURE OR COMPLEMENTARY METAL OXIDE SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a dual metal gate structure provides a dual metal gate structure having different work functions regarding a p-channel metal oxide semiconductor and an n-channel metal oxide semiconductor, the conductivity of the dual metal gate structure being not associated with a width of a gate. CONSTITUTION: A method for manufacturing a first transistor with a first gate electrode and a second transistor with a second gate electrode, on a semiconductor substrate, comprises the steps of: having a first conductive material deposited and insulated on a first portion of the semiconductor substrate, the first conductive material having a first work function; and having a second conductive material deposited and insulated on a second portion of the semiconductor substrate, the second conductive material having a second work function different from the first work function. The first conductive material is used to form the first gate electrode and the second conductive material is used to form the second gate electrode.
申请公布号 KR20000058131(A) 申请公布日期 2000.09.25
申请号 KR20000008398 申请日期 2000.02.22
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WILKS, GLEN D.;SEOMEOPELTEU, SCOTT R.
分类号 H01L27/092;H01L21/28;H01L21/336;H01L21/8238;H01L29/423;H01L29/49;(IPC1-7):H01L27/092 主分类号 H01L27/092
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