发明名称 Formation of single-crystal thin SiC films
摘要 Thin, single-crystal SiC films are obtained by means of a pyrolysis process, the substrate to be coated being covered with a carbonaceous polysilane, the adhering layer being pyrolyzed in an inert atmosphere and the amorphous layer of SiC obtained in this way being crystallized by maintaining it at a temperature of over 700 DEG C. Using a special variation of the process, it is easy to form doped SiC films. To this end the dopant is added in the form of a silane compound.
申请公布号 US6117233(A) 申请公布日期 2000.09.12
申请号 US19970907130 申请日期 1997.08.06
申请人 MAX-PLANCK-GESELLSCHAFT ZUR FORDERUNG DE 发明人 BILL, JOACHIM;LANGE, FREDERICK F.;WAGNER, THOMAS;ALDINGER, FRITZ;HEIMANN, DETLEF
分类号 C30B1/02;(IPC1-7):C30B23/02 主分类号 C30B1/02
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