发明名称 |
Formation of single-crystal thin SiC films |
摘要 |
Thin, single-crystal SiC films are obtained by means of a pyrolysis process, the substrate to be coated being covered with a carbonaceous polysilane, the adhering layer being pyrolyzed in an inert atmosphere and the amorphous layer of SiC obtained in this way being crystallized by maintaining it at a temperature of over 700 DEG C. Using a special variation of the process, it is easy to form doped SiC films. To this end the dopant is added in the form of a silane compound.
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申请公布号 |
US6117233(A) |
申请公布日期 |
2000.09.12 |
申请号 |
US19970907130 |
申请日期 |
1997.08.06 |
申请人 |
MAX-PLANCK-GESELLSCHAFT ZUR FORDERUNG DE |
发明人 |
BILL, JOACHIM;LANGE, FREDERICK F.;WAGNER, THOMAS;ALDINGER, FRITZ;HEIMANN, DETLEF |
分类号 |
C30B1/02;(IPC1-7):C30B23/02 |
主分类号 |
C30B1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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