| 摘要 |
<p>PROBLEM TO BE SOLVED: To obtain an X-ray inspection apparatus by which the defect of an inspected object can be inspected more surely. SOLUTION: An X-ray irradiation part 14 in which a product 10 is irradiated with X-rays from the upper part and an X-ray irradiation part 16 in which the product 10 is irradiated with X-rays from the side part are installed in inspection positions on a conveyance conveyor 12. An X-ray imaging part 18 which images the transmission image of the product 10 by the X-rays from the X-ray irradiation part 14 is installed in the lower part of the inspection position on the conveyance conveyor 12. An X-ray imaging part 20 which images the transmission image of the product 10 by the X-rays from the X-ray irradiation part 16 is installed on the side part of the inspection positions on the conveyance conveyor 12. An image processing part 28 processes and inspects images, of the product 10, which are imaged by the X-ray imaging parts 18, 20.</p> |
