发明名称 ETCHING APPARATUS USED IN POLISHING PROCESS OF CONTACT PLUG, CONDUCTIVE WIRING, OR INSULATED FILM
摘要 PURPOSE: An etching apparatus is to solve a problem treating waste solution produced at CMP(Chemical Mechanical Polishing) process. CONSTITUTION: An electrode(20) and a power source electrode(30) are positioned on a side of a wafer(40), so that an electric field is produced in a horizontal direction to a surface of the wafer. The electrodes are movable in a vertical or horizontal direction depending upon a process condition to shift the direction of the electric field. Many reactive chemicals enter into at a desired angle along the direction of the electrical field or the surface of the wafer. A wafer supporting frame(60) is rotatable and movable up and down to improve a uniform degree of etching across the surface of the wafer. A reactive gas is inserted toward a front of the wafer or a power source.
申请公布号 KR20000054192(A) 申请公布日期 2000.09.05
申请号 KR20000028503 申请日期 2000.05.25
申请人 GANG, JAE GOO 发明人 KANG, JAE KOO
分类号 H01L21/3213;(IPC1-7):H01L21/321 主分类号 H01L21/3213
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