发明名称 |
ETCHING APPARATUS USED IN POLISHING PROCESS OF CONTACT PLUG, CONDUCTIVE WIRING, OR INSULATED FILM |
摘要 |
PURPOSE: An etching apparatus is to solve a problem treating waste solution produced at CMP(Chemical Mechanical Polishing) process. CONSTITUTION: An electrode(20) and a power source electrode(30) are positioned on a side of a wafer(40), so that an electric field is produced in a horizontal direction to a surface of the wafer. The electrodes are movable in a vertical or horizontal direction depending upon a process condition to shift the direction of the electric field. Many reactive chemicals enter into at a desired angle along the direction of the electrical field or the surface of the wafer. A wafer supporting frame(60) is rotatable and movable up and down to improve a uniform degree of etching across the surface of the wafer. A reactive gas is inserted toward a front of the wafer or a power source.
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申请公布号 |
KR20000054192(A) |
申请公布日期 |
2000.09.05 |
申请号 |
KR20000028503 |
申请日期 |
2000.05.25 |
申请人 |
GANG, JAE GOO |
发明人 |
KANG, JAE KOO |
分类号 |
H01L21/3213;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/3213 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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