| 摘要 |
<p>A method and apparatus are provided for detecting photonic emissions. The apparatus (10) includes a field assisted photodetector which contains a light-absorbing relatively thin metallic region (16) adapted to form a photoemitter layer (11, 16) which emits photoelectrons in response to infrared light. The photodetector also includes a semiconductor layer (12) disposed against the photoemitter layer (11, 16) and adapted to form a blocking contact to photoelectron flow through an interface between the semiconductor layer (12) and metallic layer (16). The photodetector further includes a power supply adapted to induce internal field emission of the photoelectrons through the blocking contact.</p> |
