发明名称 METHOD FOR MANUFACTURING CONTACT OR WIRING IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact or wiring in a semiconductor device is provided to form a shallow contact hole and a deep contact hole by using one photolithography process. CONSTITUTION: A method for manufacturing a contact or wiring in a semiconductor device comprises the steps of: forming an interlayer dielectric on a semiconductor substrate; forming a first insulation layer on the interlayer dielectric; and applying resist on the first insulation layer and patterning the resist, so as to form a first opening and a second opening in regions for forming a contact hole and a wiring groove respectively. The diameter of the first opening formed in the region for forming the contact hole is greater than that of the second opening.
申请公布号 KR20000053408(A) 申请公布日期 2000.08.25
申请号 KR20000000560 申请日期 2000.01.07
申请人 NEC CORPORATION 发明人 NAKKAMURA RYOIJJI
分类号 H01L21/28;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/28
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