发明名称 CIRCUIT FOR MONITORING WORDLINE ACTIVATION DELAY USING SAMPLE WORDLINES ARRANGED IN DATA-STORING ARRAY
摘要 PURPOSE: A circuit for monitoring activation delay using sample wordline arranged in data-storing array is provided to determine wordline activation delay for a first subarray group in a memory by activating sample wordlines arranged in the data-storing array of a second subarray group. CONSTITUTION: A multiple bank memory(10), such as a DRAM, comprises a couple of memory units(12) provided with column decoder/sense amplifiers(19). Each memory unit(12) is determined as a memory domain comprising a memory array accessed by a set of row decoder/row control circuit in a rib(14) of the multiple bank memory(10). A first memory unit(12) comprises 4 banks(16a-16d) and a second memory unit(12) and 4 banks(16e-16h). Each bank has a plurality of sub arrays(18) and is determined as a memory domain which provides access to a plurality of data words. Each subarray(18) is determined as a bank array domain divided from other subarray by a first column decoder/sense amplifier.
申请公布号 KR20000053367(A) 申请公布日期 2000.08.25
申请号 KR20000000006 申请日期 2000.01.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 NETISDMITRI;JIEL. BRAIEON;KIRIHATADOSIAKI
分类号 G11C8/08;G11C8/14;G11C8/18;G11C11/408;G11C11/4091;(IPC1-7):G11C8/08 主分类号 G11C8/08
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