发明名称 APPARATUS FOR MEASURING JITTER TRANSFER CHARACTERISTIC
摘要 PROBLEM TO BE SOLVED: To make precisely measurable the jitter transfer characteristic of circuits to be measured, whose input/output frequencies are different from each other. SOLUTION: In this apparatus 20 measuring for a jitter transfer characteristic, a frequency conversion part 30 is installed between an input terminal 20b and a jitter detection part 35. In a calibrating operation, a signal at a frequency F1 which is outputted from a jitter generation part 21 and which is inputted via an output terminal 20a and the input terminal 20b is converted into a signal at a frequency F4 so as to be inputted to the jitter detection part 35. In a measuring operation, a signal, at a frequency F2, which is outputted from a circuit to be measured and which is inputted to the input terminal 20b is converted into a signal at the frequency F4 which is identical to that in the calibrating operation so as to be inputted to the jitter detection part 35.
申请公布号 JP2000230953(A) 申请公布日期 2000.08.22
申请号 JP19990031763 申请日期 1999.02.09
申请人 ANRITSU CORP 发明人 ISHIBE KAZUHIKO
分类号 G01R29/02;H04L25/02;(IPC1-7):G01R29/02 主分类号 G01R29/02
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