发明名称 ETCHING METHOD OF ETCH STOPPING LAYER OF SELF-ALIGNED CONTACT
摘要 PURPOSE: A method for etching an etch stopping layer of a self-aligned contact is to reduce a contact resistance and to improve a refresh characteristics of a device. CONSTITUTION: An etching method of an etch stopping layer of a self-aligned contact comprises the steps of: including a conductive layer pattern(8) covered with a first substance layer(10,12) on a semiconductor substrate(2); and etching an interlayer insulation layer(16) between the neighboring conductive layer pattern, and a second substance layer(14) formed under the insulation layer so as to form a contact hole, the second substance layer being an etch stopping layer when the interlayer insulation layer is etched using a down stream chamber.
申请公布号 KR20000052110(A) 申请公布日期 2000.08.16
申请号 KR19990002966 申请日期 1999.01.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YONG HYEON;GO, HO;LEE, SEUNG HYEONG;KIM, DONG YUN
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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