发明名称 |
ETCHING METHOD OF ETCH STOPPING LAYER OF SELF-ALIGNED CONTACT |
摘要 |
PURPOSE: A method for etching an etch stopping layer of a self-aligned contact is to reduce a contact resistance and to improve a refresh characteristics of a device. CONSTITUTION: An etching method of an etch stopping layer of a self-aligned contact comprises the steps of: including a conductive layer pattern(8) covered with a first substance layer(10,12) on a semiconductor substrate(2); and etching an interlayer insulation layer(16) between the neighboring conductive layer pattern, and a second substance layer(14) formed under the insulation layer so as to form a contact hole, the second substance layer being an etch stopping layer when the interlayer insulation layer is etched using a down stream chamber.
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申请公布号 |
KR20000052110(A) |
申请公布日期 |
2000.08.16 |
申请号 |
KR19990002966 |
申请日期 |
1999.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YONG HYEON;GO, HO;LEE, SEUNG HYEONG;KIM, DONG YUN |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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地址 |
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