发明名称 Positive photosensitive resin composition, method of forming relief pattern, and electronic part
摘要 Positive photosensitive resin compositions, which comprise (A) a polyamidate having repetitive units of general formula (I) <CHEM> wherein R<1> is a tetravalent organic group, R<2> is a divalent organic group having a phenolic hydroxyl group, three R<3> groups and three R<4> groups each independently are an alkyl group or a hydrogen atom, and at least two R<3> groups and at least two R<4> groups are alkyl groups, and (B) a compound capable of generating an acid when exposed to light, are improved in storage stability and exposure sensitivity to i-line. Such compositions can improve the reliability of electronic parts when formed into surface-protecting films or interlayer insulating films by a method including exposure to i-line, development and heating.
申请公布号 EP1028354(A1) 申请公布日期 2000.08.16
申请号 EP20000102153 申请日期 2000.02.08
申请人 HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. 发明人 SASAKI, MAMORU
分类号 H05K3/46;C08K5/28;C08L79/08;G03F7/022;G03F7/037;G03F7/039;H01L21/027;H01L21/312;H05K1/00;H05K1/03 主分类号 H05K3/46
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