发明名称 |
TEMPERATURE STABILIZING CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To reduce jitter level by stabilizing the junction temperature of a timing generator comprising a CMOS gate array. SOLUTION: A reference temperature detecting means 11 stores the highest value of junction temperature of an LSI 1 after converting into the number of reference pulses. A working temperature detecting means 12 stores the junction temperature of the LSI during operation after converting it into the number of working pulses. A current control means 13 compares the number of working pulses with the number of reference pulses and regulates the working current of a CMOS gate array T.G.10 such that they are matched each other thus controlling the junction temperature. According to the arrangement, jitter level of a timing generator comprising a CMOS gate array can be reduced significantly.
|
申请公布号 |
JP2000228493(A) |
申请公布日期 |
2000.08.15 |
申请号 |
JP19990120739 |
申请日期 |
1999.04.27 |
申请人 |
ANDO ELECTRIC CO LTD |
发明人 |
NAKAIZUMI KAZUO;SUZUKI HIROYASU |
分类号 |
H01L27/04;H01L21/822;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|