发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To raise the temperature resistance cycle property by reinforcing the strength of a board. SOLUTION: This device 1 is composed of a circuit pattern and a solder ball mounting lands 3, 3,... which are made on a board, and a solder ball mounting land 5 of normal size which is made in larger area than a normal size of land 3 for mounting solder ball, in a region 4 where a semiconductor integrated circuit chip is mounted, at the center of the board 2. The solder ball mounting land 5 is made in such area as to include the four places of the solder ball mounting land 3 having a normal size. This device 1 is secondarily mounted on a mother board, and it can withstand the stress by temperature cycle enough since it is reinforced by the solder ball mounting land 5 even if it is subjected to the repeated stress of expansion and contraction by heat.
申请公布号 JP2000228453(A) 申请公布日期 2000.08.15
申请号 JP19990028674 申请日期 1999.02.05
申请人 SEIKO EPSON CORP 发明人 SUZUKI KAZUHIKO
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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