发明名称 X-RAY EXAMINATION APPARATUS AND METHOD FOR ADJUSTING THE SAME
摘要 <p>An X-ray examination apparatus comprises an X-ray source (2), an X-ray detector (3) and an X-ray filter (4) arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter (4) comprises a plurality of filter elements (5) each comprising a vessel containing an X-ray absorbing liquid, the liquid level in each vessel determining the X-ray absorptivity of the respective filter element (5). Control means (7) is provided for applying electric voltages to the individual filter elements (5) to change the liquid levels within an adjust time period. The control means (7) is arranged to apply a respective control voltage to each individual filter element a repeat number of times within the adjust time period, the repeat number being selected so as substantially to maximise the rate of change of liquid level of the filter elements. This enables patient examination times to be reduced, by reducing the times between sequential images.</p>
申请公布号 WO2000042619(A1) 申请公布日期 2000.07.20
申请号 EP2000000075 申请日期 2000.01.07
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