| 摘要 |
PURPOSE: A semiconductor memory is provided to operate different function tests for each bank in a memory cell array composed of plural banks. CONSTITUTION: Multiplexers(210) receive normal addresses from an address controller(204) and addresses from a test mode address controller(206). The multiplexers are controlled by test mode control signals from a bank test mode controller(208). The multiplexers output the normal addresses in a normal operation mode and outputs test addresses in a test mode. The addresses from the multiplexers are transferred to each bank(218). Multiplexer/demultiplexers(216) are connected to each bank while being controlled by read/write control signals from a read/write controller(202) and test mode control signals from the bank test mode controller. Thus, normal/test data are transferred between a data input/output controller(214) and each bank. Therefore, different function tests are operated for each bank.
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