TEST SYSTEM OF SEMICONDUCTOR CHIP AND TESTER

摘要

PURPOSE: A test system of a semiconductor chip is provided to increase a chip reliability by performing a test against a ground noise. CONSTITUTION: A test system of a semiconductor chip comprises a tester(100), a semiconductor chip(200) and a driver integrated circuit(300). The driver integrated circuit(300) has input terminals(30-1-30-n), output terminals(32-1-32-n), a power supply voltage terminal(34), and a ground voltage terminal(36). The input terminals(30-1-30-n)are connected in common to an output terminal of a pin driver(10) in the tester(100), and the output terminals(32-1-32-n) are connected in common to a ground voltage pin(20) of the semiconductor chip(200). When a control signal is outputted from the pin driver, a ground noise is generated at the ground voltage pin(20) of the semiconductor chip(200) through the driver integrated circuit(300).