发明名称 FORMATION METHOD OF METAL DISTRIBUTION
摘要 PURPOSE: A metal distribution formation is provided by lowering a contact resistance value, and by removing the problems to weaken an adhesion because of the penetration of fluorine gas. CONSTITUTION: A formation method of the metal distributions contains the following processes: a process to deposit in vapor the dielectric layers having the contact holes so as to disclose a region in semiconductor substrate; a process to deposit in vapor the thin barrier layers and cobalt layers orderly thereon; a process to grow up the cobalt silicide layers below the contact holes being contacted the semiconductor substrate and the barrier layers by rapid thermal process; and a process to form the metal distribution layers in the contact holes and on the cobalt layers.
申请公布号 KR20000041873(A) 申请公布日期 2000.07.15
申请号 KR19980057886 申请日期 1998.12.23
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, Y,EONG SU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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