发明名称 |
FORMATION METHOD OF METAL DISTRIBUTION |
摘要 |
PURPOSE: A metal distribution formation is provided by lowering a contact resistance value, and by removing the problems to weaken an adhesion because of the penetration of fluorine gas. CONSTITUTION: A formation method of the metal distributions contains the following processes: a process to deposit in vapor the dielectric layers having the contact holes so as to disclose a region in semiconductor substrate; a process to deposit in vapor the thin barrier layers and cobalt layers orderly thereon; a process to grow up the cobalt silicide layers below the contact holes being contacted the semiconductor substrate and the barrier layers by rapid thermal process; and a process to form the metal distribution layers in the contact holes and on the cobalt layers.
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申请公布号 |
KR20000041873(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057886 |
申请日期 |
1998.12.23 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, Y,EONG SU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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