发明名称 METHOD OF FORMING INTERLAYER INSULATING FILM IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming an interlayer insulating film is to prevent a peel-off defect between an interlayer insulating film composed of multi-layers form being generated. CONSTITUTION: A method of forming an interlayer insulating film comprises the steps of: providing a wiring(23) on a substrate(21) and forming on the substrate a first interlayer insulating film(25) covering the wiring; coating on the first interlayer insulating film insulation material with good fluidity, to form a second interlayer insulating film(27) having a flat surface; reacting the surface of the second insulating film with O2 plasma to form a third interlayer(29) insulating film having an unstable bonding state and a coarse surface; and forming a fourth interlayer insulating film, which fourth interlayer insulating film effecting a stable bonding state at a surface contacting the third interlayer insulating film by mutual atomic exchange and rearrangement.
申请公布号 KR20000040720(A) 申请公布日期 2000.07.05
申请号 KR19980056439 申请日期 1998.12.19
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, CHANG HUN
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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