发明名称 |
METHOD OF FORMING INTERLAYER INSULATING FILM IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming an interlayer insulating film is to prevent a peel-off defect between an interlayer insulating film composed of multi-layers form being generated. CONSTITUTION: A method of forming an interlayer insulating film comprises the steps of: providing a wiring(23) on a substrate(21) and forming on the substrate a first interlayer insulating film(25) covering the wiring; coating on the first interlayer insulating film insulation material with good fluidity, to form a second interlayer insulating film(27) having a flat surface; reacting the surface of the second insulating film with O2 plasma to form a third interlayer(29) insulating film having an unstable bonding state and a coarse surface; and forming a fourth interlayer insulating film, which fourth interlayer insulating film effecting a stable bonding state at a surface contacting the third interlayer insulating film by mutual atomic exchange and rearrangement.
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申请公布号 |
KR20000040720(A) |
申请公布日期 |
2000.07.05 |
申请号 |
KR19980056439 |
申请日期 |
1998.12.19 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, CHANG HUN |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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