发明名称 TEST DEVICE FOR ELECTRONIC PARTS
摘要 PROBLEM TO BE SOLVED: To prevent damage to electronic parts and test at a precise temperature by suppressing self-heating of electronic parts during the test. SOLUTION: The test device for electronic parts performs testing by pressing a plurality of terminals of electronic parts to be tested to a contact pin 51 on a test head in a state that the parts are mounted on a test tray. The device is provided with a pressure base 34 capable of approaching, separating and moving for the contact pin 51, a pressure block 31 integrally or separately provided and brought into contact with the electronic parts to be tested from an opposite face of the contact pin 51 to press them, and a heat absorbing and radiating body 38 provided on the pressure block 31.
申请公布号 JP2000187060(A) 申请公布日期 2000.07.04
申请号 JP19980364356 申请日期 1998.12.22
申请人 ADVANTEST CORP 发明人 SAITO NOBORU
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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